超声干涉法薄层厚度测量声阻抗匹配判据及其应用
陈秀明;林莉;李喜孟;郭广平
Acoustic Impedance Matching Criteria and Their Applications for Layer Thickness Measurement by Ultrasonic Interferometry
CHEN Xiu-ming;LIN Li;LI Xi-meng;GUO Guang-ping
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