Acoustic Impedance Matching Criteria and Their Applications for Layer Thickness Measurement by Ultrasonic Interferometry
CHEN Xiu-ming;LIN Li;LI Xi-meng;GUO Guang-ping
Journal of Aeronautical Materials ›› 2009, Vol. 29 ›› Issue (1) : 87-91.
Acoustic Impedance Matching Criteria and Their Applications for Layer Thickness Measurement by Ultrasonic Interferometry
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